Difference between EDS and WDS spectroscopy

EDS (Energy Dispersive X-ray Spectroscopy) and WDS (Wavelength Dispersive X-ray Spectroscopy) are two different types of X-ray spectroscopy techniques used for elemental analysis. They differ primarily in their methods of detecting and analyzing X-rays. Here are the key differences between EDS and WDS spectroscopy:

  1. Detection and Dispersion of X-rays:
    • EDS: EDS relies on the energy dispersion of X-rays. In EDS, a semiconductor detector is used to measure the energy of X-rays emitted from a sample. The detector records the entire energy spectrum simultaneously, allowing for the identification of multiple elements in a single spectrum.
    • WDS: WDS, on the other hand, relies on the wavelength dispersion of X-rays. In WDS, a crystal monochromator is used to separate X-rays based on their wavelengths. The crystal is adjusted to diffract only a specific X-ray wavelength, allowing for the precise measurement of the intensity of a single X-ray line at a time.
  2. Resolution and Sensitivity:
    • EDS: EDS has a broader energy resolution compared to WDS, meaning that it is less capable of resolving closely spaced X-ray lines. However, EDS is generally more sensitive to lower energy X-rays.
    • WDS: WDS has higher energy resolution, making it suitable for resolving closely spaced X-ray lines and distinguishing between elements with overlapping X-ray emissions. WDS is often preferred when high precision and accuracy are required.
  3. Speed and Throughput:
    • EDS: EDS is generally faster than WDS in terms of data acquisition. Since it measures the entire X-ray spectrum simultaneously, it can provide elemental information across a wide energy range in a shorter time.
    • WDS: WDS is slower because it involves scanning through different crystal positions to select specific X-ray lines for analysis. This sequential scanning process reduces the throughput compared to EDS.
  4. Application and Sample Types:
    • EDS: EDS is commonly used in conjunction with scanning electron microscopes (SEM) for elemental analysis of small sample areas. It is well-suited for analyzing samples with complex compositions.
    • WDS: WDS is often used with electron probe microanalyzers (EPMA) for precise elemental analysis, especially when dealing with samples that require high accuracy and resolution, such as geological and metallurgical specimens.

In summary, while both EDS and WDS are X-ray spectroscopy techniques used for elemental analysis, they differ in their methods of X-ray detection, resolution, speed, and application. The choice between EDS and WDS depends on the specific analytical requirements and characteristics of the sample being studied.