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XPS Analysis for Composite Materials

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful analytical technique employed in the characterization of composite materials. Composite materials, which consist of two or more different components, present unique challenges in terms of understanding surface composition, bonding, and the distribution of elements. XPS is instrumental in providing valuable insights into the chemical composition and surface properties of composite materials.

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SEM Analysis for Electronics Applications

Scanning Electron Microscopy (SEM) is a powerful imaging and analytical technique widely utilized in the field of electronics. This high-resolution microscopy method allows for detailed examination of electronic components at the nanoscale, offering insights into surface morphology, material composition, and device structures. SEM plays a crucial role in quality control, failure analysis, and research and development within the electronics industry.

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XPS Analysis for Polymer

Embark on a transformative journey into the molecular realm of polymers with our cutting-edge X-ray Photoelectron Spectroscopy (XPS) Analysis services at Rocky Mountain Laboratories. Immerse yourself in the microscopic details of polymer surfaces, uncovering essential insights into their chemical composition and surface properties.

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